발간논문

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To investigate the effect of grain size on the core loss of non-oriented electrical steels, specimens containing various amount of Si were taken from commercially produced cold rolled sheets and annealed for grain growth. The annealing experiments were carried out in a double-stage mode in which the specimens were decarburized with wet H₂+N₂ atmosphere in the first stage and then annealed with dry atmosphere at various temperatures in the second stage. The core loss decreased initially and then increased along with the increased of grain size, therefore there existed an optimum grain size showing minimum value of core loss. It was also found that the optimum grain size is varying with the content of Si, such as 35㎛ at 0.81 wt%Si, 60㎛ at 2.13 wt%Si and 85 ㎛ at 3.20 wt%Si in this study. Since the texture coefficient of the specimens didn`t show any specific tendency on grain size, the behavior of core loss is considered to be mainly due to the grain size.

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HgCdTe is the most widely used material for infrared photodetectors. HgCdTe epi-layers were grown on CdTe substrates with (111) orientation, using a slider LPE(Liquid Phase Epitaxy) technique. The change of surface morphology during LPE growth of Hg_(0.7)Cd_(0.3)Te was investigated. The wave-like surface at the initial stage of growth has transformed gradually to the terrace-like surface and the terrace width has increased with increasing growth time. Infrared tansmission was used to determine the composition of HgCdTe epi-layers.

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