발간논문

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The research efforts on GaN-based light-emitting diodes (LEDs) keep increasing due to their significant impact on the illumination industry. Surface mount technology (SMT) is widely used to mount the LED packages for practical application. In surface mount soldering both the device body and leads are intentionally heated by a reflow process. We studied on the effects of multiple reflows on microstructural variation and joint strength of the solder joints between the LED package and the substrate. In this study, Pb-free Sn-3.0Ag-0.5Cu solder and a finished pad with organic solderability preservatives (OSP) were employed. A Cu6Sn5 intermetallic compound (IMC) layer was formed during the multiple reflows, and the thickness of the IMC layerincreased with an increasing number of reflows. The shear force decreased after three reflows. From the observation of the fracture surface after a shear test, partially brittle fractures were observed after five reflows.

keyword : intermetallics, bonding, mechanical properties, shear test, LED package

The reactions between a Sn-3.0Ag-0.5Cu solder alloy and electroless Ni/electroless Pd/immersion Au (ENEPIG) surface finishes with various Pd layer thicknesses (0, 0.05, 0.1, 0.2, 0.4 μm) were examined for the effect of the Pd layer on the massive spalling of the (Cu,Ni)6Sn5 layer during reflow at 235℃. The thin layer deposition of an electroless Pd (EP) between the electroless Ni (7 μm) and immersion Au (0.06 μm) plating on the Cu substrate significantly retarded the massive spalling of the (Cu,Ni)6Sn5 layer during reflow. Its retarding effect increased with an increasing EP layer thickness. When the EP layer was thin (≤0.1 μm), the retardation of the massive spalling was attributed to a reduced growth rate of the (Cu,Ni)6Sn5 layer and thus to a lowered consumption rate of Cu in the bulk solder during reflow. However, when the EP layer was thick (≥0.2 μm), the initially dissolved Pd atoms in the molten solder resettled as (Pd,Ni)Sn4 precipitates near the solder/(Cu,Ni)6Sn5 interface with an increasing reflow time. Since the Pd resettlement requires a continuous Ni supply across the (Cu,Ni)6Sn5 layer from the Ni(P) substrate, it suppressed the formation of (Ni,Cu)3Sn4 at the (Cu,Ni)6Sn5/Ni(P) interface and retarded the massive spalling of the (Cu,Ni)6Sn5 layer.

keyword : electronic matrials, soldering, microstructure, scanning electron microscopy, palladium surface finish