| The magnetic properties of amorphous Fe_(80)Si_xP_(20-x) alloys prepared by single roller quenching method have been investigated by Vibrating Sample Magnetometer and DC B-H loop tracer. The electrical properties and structure analysis have been studied by Electrical resistance measurement apparatus and X-ray diffractometer. The results are as follows; 1. The amorphous forming range of Fe_(80)Si_xP_(20-x) alloy s is 2≤x≤10, and the density increases linearly from 6.95 gr/cc at x=2 to 7.09 gr/cc at x=10 with increasing Si concentration. 2. The saturation magnetization and coercive force increase linearly from 152 gr/cc at x=2 to 168emu/gr at x=10 and from 0.29 Oe at x=2 to 7.37 oe at x=10 with increasing Si concentration, respectively. 3. The crystallization temperature and curie temperature increase from 695k at x=2 to 770K at x=10 and from 593k at x=2 to 643k at x=10 with increasing Si concentration, respectively. The crystallization temperature is about 100∼130K larger than curie temperature. 4. The electrical resistivity of amorphous state is from 150μΩ㎝ at x=2 to 155μΩ㎝ at x=10 with increasing Si concentration, and the amorphous state is about 40μΩ㎝ larger than that of crystallized state. 5. The temperature coefficient of resistivity for amorphous state is about 10 times larger than that of crystallized state, and increase linearly with increasing Si concentration. |
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