Characterization of the interface of SiC_p/Al composites was performed based on the experimental data obtained from X-ray diffraction, SEM, TEM, EDS, AES, and DSC. X-ray diffraction performed on the electrochemically extracted SiC_p showed that the interfacial reaction products consist of Al₄C₃ and pure Si having hexagonal and diamond cubic crystallographic structure, respectively. According to the experimental results obtained from the interfacial reaction products using SEM, TEM, and AES, Al₄C₃ was found to have a hexagonal plateletshape and Si is observed to exist as a dendritic pattern. Although severe interfacial reaction tends to occur at elevated temperature. Al₄C₃ and Si were found to form at the composite even at 450℃. |
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