| Abstract |
| Atomic arrangement of layer structures in n-type Bi2(Te0.95Se0.05)3 thermoelectric compound fabricated by gas atomizing and hot extrusion was investigated by high resolution electron microscope (HREM). Two kinds of grains having five and seven atomic layered packs are observed in hot extruded material. The sequence of five atomic layers, i.e. Te-Bi-Te-Bi-Te corresponded to one quintet along c-axis of the Bi2Te3 crystal structure. On the other hand, the seven atomic layers occur in the sequence Te-Bi-Te-Bi-Te-Bi-Bi corresponding to one septet of Bi4Te3 crystal structure and can be described by insertion of two Bi layers between quintets of Bi2Te3 structure. The occurrence Bi3Te4 layered structure can be interpreted resulting in local composition change by rapid solidification process. |
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| Key Words |
| n-type Bi2(Te(0.95)Se(0.05))3 thermoelectric compound, Layered structure, High resolution electron microscope, Image simulation |
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