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Vol.51, No.1, 63 ~ 70, 2013
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| Title |
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| Min Su Kim , Soa Ram Kim , Gi Woong Nam , Hyung Gil Park , Hyun Sik Yoon , Jae Young Leem |
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| Abstract |
| Nano-fibrous ZnO thin films were grown on porous silicon (PS) by sol-gel spin-coating method. Atomic force microscopy, X-ray diffraction, Raman, and photoluminescence were carried out to investigate the structural and optical properties of the nano-fibrous ZnO thin films. When the nano-fibrous thin films were grown on PS, their residual stress could be reduced, and the full width at half maximum (FWHM) of the ZnO (002) diffraction peak and near-band-edge emission (NBE) peak were decreased, indicating that the optical as well as the structural properties were enhanced. Furthemore, white light emission was observed from nano-fibrous ZnO thin films grown on PS. |
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| Key Words |
| ZnO, porous Si, nano pore, sol-gel, optical properties, atomic force microscopy, photoluminescence |
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