| Abstract |
| In this study, the critical role of substrate bias during the sputter deposition of Al thin films is discussed. Two sets of Al thin films having a nominal thickness of 300 nm were deposited at sputtering pressures of 4.1 and 1.5 mTorr, respectively, with an applied negative substrate bias in the range of 0-200 V. It was found that the microstructure, surface roughness, film resistivity and grain size were greatly altered by the combination of bias magnitudes and sputtering pressures. The sputtering pressure of 4.1 mTorr resulted in greater changes in the film properties with the application of substrate bias, and a lesser but still significant degree was observed for the films deposited at 1.5 mTorr. The resistivity values for the films deposited at 1.5 mTorr were found to be significantly lower, with the lowest resistivity value of 3.1 μΩcm achieved at a substrate bias of 50 V. Based on grain size measured by the line intercept method and Mayadas- Shatzkes grain boundary scattering model, the resistivity contribution of grain boundary scattering for the lowest-resistivity film was found to be 0.37 μΩcm, which indicates that the film resistivity in the optimized condition is close to the known bulk resistivity of 2.65 μΩcm. |
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| Key Words |
| aluminum, sputter, thin films, substrate bias, grain size |
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